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Archive for category: Measurement and modelling

On-Chip Combined C-V/I-V Transistor Characterization System in 45-nm CMOS

January 2011/in Measurement and modelling, Publications/by awp-admin
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Random telegraph noise in 45-nm CMOS: analysis using an on-chip test and measurement system

January 2010/in Measurement and modelling, Publications/by awp-admin
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On-chip transistor characterisation arrays for variability analysis

January 2007/in Measurement and modelling, Publications/by awp-admin
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